DocumentCode :
3781915
Title :
Ultra-broadband material spectroscopy from scattering parameters obtained from time domain measurements
Author :
Ajay Bandla;Nathaniel Hager;Mohammad-Reza Tofighi
Author_Institution :
Electrical Engineering, Pennsylvania State University, Capital College, Middletown, Pennsylvania 17057, USA
fYear :
2014
Firstpage :
1
Lastpage :
3
Abstract :
Scattering parameter measurements can provide a key insight towards understanding material properties, pertaining to permittivity. The relaxation phenomena (e.g. free and bond water relaxation) and the frequencies at which they occur can convey valuable information in dielectric spectroscopy for material process monitoring and biology research. These relaxations can range from kHz to GHz range. Extracting the reflection/transmission coefficients or scattering parameters from time domain measurements over a broad range of frequencies, from kHz to GHz, can be challenging. The current approach often employed by material scientists involves performing Laplace transform, through a numerical integration, on the time domain data. On the other hand, the more computationally efficient fast Fourier transform (FFT) techniques have been well-developed and widely used in the engineering community. In this study, we propose a method, based on fast Fourier transform (FFT) of non-uniformly sampled time domain reflectometry (TDR) data, to obtain the frequency domain information in an ultra-broadband range from kHz to GHz. We test this method to known lossy materials.
Keywords :
"Time-domain analysis","Frequency-domain analysis","Time measurement","Permittivity measurement","Dielectrics","Spectroscopy"
Publisher :
ieee
Conference_Titel :
Microwave and Antenna Sub-systems for Radar, Telecommunications, and Biomedical Applications (BenMAS), 2014 IEEE Benjamin Franklin Symposium on
Type :
conf
DOI :
10.1109/BenMAS.2014.7529467
Filename :
7529467
Link To Document :
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