• DocumentCode
    3782182
  • Title

    Testing analog circuits by supply voltage variation and supply current monitoring

  • Author

    Y. Kilic;M. Zwolinski

  • Author_Institution
    Southampton Univ., UK
  • fYear
    1999
  • Firstpage
    155
  • Lastpage
    158
  • Abstract
    A technique for sensitizing faults in analog circuits by varying the supply voltage and monitoring the supply current is discussed. The detection of short circuit faults is demonstrated with a simple CMOS circuit. The technique is applied to a larger analog circuit and significantly improved fault cover is obtained.
  • Keywords
    "Circuit testing","Analog circuits","Voltage","Current supplies","Monitoring","Circuit faults","Logic testing","Semiconductor device modeling","Switches","CMOS analog integrated circuits"
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits, 1999. Proceedings of the IEEE 1999
  • Print_ISBN
    0-7803-5443-5
  • Type

    conf

  • DOI
    10.1109/CICC.1999.777264
  • Filename
    777264
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3782182