DocumentCode
3782812
Title
Micromachined experimental structure for optimization of multilayer p/sup +/Si/(metal, semiconductor) thermopile IR detectors and thermal converters
Author
D. Randjelovic;Z. Djuric;R. Petrovic;Z. Lazic;T. Dankovic
Author_Institution
Inst. of Microelectron. Technol. & Single Crystals, Belgrade Univ., Serbia
Volume
2
fYear
2000
Firstpage
595
Abstract
This paper presents the design and fabrication technique of a test structure with p/sup +/Si/metal and p/sup +/Si/sputtered-Si thermopiles intended for optimization of performance of multilayer thermopile IR detectors and thermal converter. An experimental structure is fabricated using micromachining techniques.
Keywords
"Nonhomogeneous media","Fabrication","Testing","Temperature sensors","Thermal sensors","Gold","Temperature dependence","Semiconductor device measurement","Silicon","Infrared detectors"
Publisher
ieee
Conference_Titel
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Print_ISBN
0-7803-5235-1
Type
conf
DOI
10.1109/ICMEL.2000.838761
Filename
838761
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