DocumentCode
3782823
Title
Cell design for boundary-scan implementation
Author
V. Panic;S. Jankovic;D. Milovanovic;V. Litovski
Author_Institution
Fac. of Electron. Eng., Nis Univ., Serbia
Volume
2
fYear
2000
Firstpage
719
Abstract
This paper gives a new approach in cell design for boundary-scan implementation. After recalling on major problems in PCBs testing, a short overview of boundary-scan standard is given. Furthermore, logic level synthesis of boundary-scan cells are done. Logic level design of these cells are used for layout generation. From generated layout, netlist for each circuit is extracted, and after that simulated by Alecsis2.4. The simulation results are compared with expected values, and are presented in appropriate manner.
Keywords
"Circuit testing","Logic testing","Circuit simulation","Printed circuits","Nails","Integrated circuit testing","Binary search trees","Clocks","Logic design","Packaging"
Publisher
ieee
Conference_Titel
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Print_ISBN
0-7803-5235-1
Type
conf
DOI
10.1109/ICMEL.2000.838791
Filename
838791
Link To Document