• DocumentCode
    3782823
  • Title

    Cell design for boundary-scan implementation

  • Author

    V. Panic;S. Jankovic;D. Milovanovic;V. Litovski

  • Author_Institution
    Fac. of Electron. Eng., Nis Univ., Serbia
  • Volume
    2
  • fYear
    2000
  • Firstpage
    719
  • Abstract
    This paper gives a new approach in cell design for boundary-scan implementation. After recalling on major problems in PCBs testing, a short overview of boundary-scan standard is given. Furthermore, logic level synthesis of boundary-scan cells are done. Logic level design of these cells are used for layout generation. From generated layout, netlist for each circuit is extracted, and after that simulated by Alecsis2.4. The simulation results are compared with expected values, and are presented in appropriate manner.
  • Keywords
    "Circuit testing","Logic testing","Circuit simulation","Printed circuits","Nails","Integrated circuit testing","Binary search trees","Clocks","Logic design","Packaging"
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
  • Print_ISBN
    0-7803-5235-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.2000.838791
  • Filename
    838791