• DocumentCode
    37834
  • Title

    A Broadband, Micromachined Rectangular Waveguide to Cavity-Backed Coplanar Waveguide Transition Using Impedance-Taper Technique

  • Author

    Moallem, Mehrdad ; East, Jack ; Sarabandi, Kamal

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • Volume
    4
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    49
  • Lastpage
    55
  • Abstract
    This paper presents a broadband fully micromachined transition from rectangular waveguide to cavity-backed CPW line for submillimeter-wave (sub-MMW) and terahertz applications. A cavity-backed CPW line (CBCBW) is a planar transmission line that is designed and optimized for minimum loss while providing 50- Ω characteristic impedance. This line is shown to provide less than 0.12 dB/mm loss over the entire J-band (220-325 GHz). The transition from CBCPW to waveguide is realized in three steps to achieve a broadband response with a topology amenable to silicon micromachining. The first step is a tapered transition from the CBCPW line to a 50- Ω reduced-height waveguide. The next two steps utilize a novel in-plane impedance tapering technique to transition from the reduced-height waveguide to the on-wafer regular height waveguide. The full transition has less than 0.9 dB of insertion loss and more than 13 dB of return loss over the entire J-band (39% bandwidth). Silicon micromachining technology is used to fabricate prototypes of back-to-back CBCPW line-to-waveguide transitions. A novel waveguide-probe measurement setup is introduced and utilized to evaluate the performance of the transitions and the CBCPW lines.
  • Keywords
    coplanar waveguides; elemental semiconductors; micromachining; rectangular waveguides; silicon; transmission lines; waveguide transitions; CBCBW; broadband micromachined rectangular waveguide; cavity-backed coplanar waveguide transition; frequency 220 GHz to 325 GHz; in-plane impedance tapering technique; planar transmission line; resistance 50 ohm; silicon micromachining; waveguide probe measurement setup; Coplanar waveguides; Impedance; Micromachining; Silicon; Substrates; Waveguide transitions; Cavity-backed coplanar waveguide (CBCPW); in-plane impedance taper; micromachining technology; multistep transition; waveguide probe measurement setup;
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • DOI
    10.1109/TTHZ.2013.2293876
  • Filename
    6692899