DocumentCode :
3783876
Title :
Limitations of criteria for testing transistor circuits for multiple DC operating points
Author :
L. Kronenberg;W. Mathis;L. Trajkovic
Author_Institution :
Dept. of Electr. Eng., Magdeburg Univ., Germany
Volume :
1
fYear :
2000
Firstpage :
148
Abstract :
Addresses the problem of determining whether a transistor circuit possesses multiple dc operating points. We investigate how the sign change of the determinant corresponding to the Jacobian matrix associated with circuit equations can be used to indicate the number of dc operating points in a transistor circuit. We give circuit examples that illustrate that these criteria may not be reliable, and show that resistor values that determine the number of a circuit´s dc operating points, may or may not affect the value of the calculated determinant. Even if the mere existence of a feedback structure depends on whether a particular resistor is open- or short-circuited, the resistor value may not affect the value of the determinant. Hence, the determinant criteria is not always indicative of the number of a circuit´s dc operating points.
Keywords :
"Circuit testing","Feedback circuits","Jacobian matrices","Resistors","Bipolar transistors","Circuit analysis","Nonlinear equations","Voltage","Newton method","Circuit topology"
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Print_ISBN :
0-7803-6475-9
Type :
conf
DOI :
10.1109/MWSCAS.2000.951607
Filename :
951607
Link To Document :
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