Title :
Testing random variables for independence and identity
Author :
T. Batu;E. Fischer;L. Fortnow;R. Kumar;R. Rubinfeld;P. White
Author_Institution :
Dept. of Comput. Sci., Cornell Univ., Ithaca, NY, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
Given access to independent samples of a distribution A over [n] /spl times/ [m], we show how to test whether the distributions formed by projecting A to each coordinate are independent, i.e., whether A is /spl epsi/-close in the L/sub 1/ norm to the product distribution A/sub 1//spl times/A/sub 2/ for some distributions A/sub 1/ over [n] and A/sub 2/ over [m]. The sample complexity of our test is O/spl tilde/(n/sup 2/3/m/sup 1/3/poly(/spl epsi//sup -1/)), assuming without loss of generality that m/spl les/n. We also give a matching lower bound, up to poly (log n, /spl epsi//sup -1/) factors. Furthermore, given access to samples of a distribution X over [n], we show how to test if X is /spl epsi/-close in L/sub 1/ norm to an explicitly specified distribution Y. Our test uses O/spl tilde/(n/sup 1/2/poly(/spl epsi//sup -1/)) samples, which nearly matches the known tight bounds for the case when Y is uniform.
Keywords :
"Testing","Random variables","Computer science","National electric code","Cities and towns","Statistics"
Conference_Titel :
Foundations of Computer Science, 2001. Proceedings. 42nd IEEE Symposium on
Print_ISBN :
0-7695-1116-3
DOI :
10.1109/SFCS.2001.959920