• DocumentCode
    3784019
  • Title

    Steganalysis based on image quality metrics

  • Author

    I. Avcibas;M. Nasir;B. Sankur

  • Author_Institution
    Dept. of Electron. Eng., Uludag Univ., Bursa, Turkey
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    517
  • Lastpage
    522
  • Abstract
    We present techniques for steganalysis of images that have been potentially subjected to a watermarking algorithm. We show that watermarking schemes leave statistical evidence or structure that can be exploited for detection with the aid of proper selection of image features and multivariate regression analysis. We use some image quality metrics as the feature set to distinguish between watermarked and unwatermarked images and furthermore distinguish between different watermarking techniques. To identify specific quality measures that provide the best discriminative power, we use analysis of variance (ANOVA) techniques. Multivariate regression analysis is then used on the selected quality metrics to build an optimal classifier using a set of test images and their blurred versions. Simulation results with a specific feature set and some well-known and publicly available watermarking techniques indicate that our approach is able to accurately distinguish with high accuracy between images marked by different watermarking techniques.
  • Keywords
    "Image quality","Watermarking","Analysis of variance","Steganography","Multivariate regression","Image analysis","Noise robustness","Power measurement","Testing","Algorithm design and analysis"
  • Publisher
    ieee
  • Conference_Titel
    Multimedia Signal Processing, 2001 IEEE Fourth Workshop on
  • Print_ISBN
    0-7803-7025-2
  • Type

    conf

  • DOI
    10.1109/MMSP.2001.962785
  • Filename
    962785