DocumentCode :
3784019
Title :
Steganalysis based on image quality metrics
Author :
I. Avcibas;M. Nasir;B. Sankur
Author_Institution :
Dept. of Electron. Eng., Uludag Univ., Bursa, Turkey
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
517
Lastpage :
522
Abstract :
We present techniques for steganalysis of images that have been potentially subjected to a watermarking algorithm. We show that watermarking schemes leave statistical evidence or structure that can be exploited for detection with the aid of proper selection of image features and multivariate regression analysis. We use some image quality metrics as the feature set to distinguish between watermarked and unwatermarked images and furthermore distinguish between different watermarking techniques. To identify specific quality measures that provide the best discriminative power, we use analysis of variance (ANOVA) techniques. Multivariate regression analysis is then used on the selected quality metrics to build an optimal classifier using a set of test images and their blurred versions. Simulation results with a specific feature set and some well-known and publicly available watermarking techniques indicate that our approach is able to accurately distinguish with high accuracy between images marked by different watermarking techniques.
Keywords :
"Image quality","Watermarking","Analysis of variance","Steganography","Multivariate regression","Image analysis","Noise robustness","Power measurement","Testing","Algorithm design and analysis"
Publisher :
ieee
Conference_Titel :
Multimedia Signal Processing, 2001 IEEE Fourth Workshop on
Print_ISBN :
0-7803-7025-2
Type :
conf
DOI :
10.1109/MMSP.2001.962785
Filename :
962785
Link To Document :
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