• DocumentCode
    3784053
  • Title

    Building a test schedule for automotive microsystems using accelerated testing models

  • Author

    V.E. Ilian;M. Dragan;M. Bazu;G. Socol

  • Author_Institution
    Nat. Inst. for Res. & Dev. in Microtechnologies, Bucharest, Romania
  • Volume
    2
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    403
  • Abstract
    A generalized Arrhenius model was used to build a test schedule containing high temperature and high temperature/high humidity stresses applicable to automotive microsystems.
  • Keywords
    "Automotive engineering","Life estimation","Stress","Databases","Humidity","Temperature","Life testing","Automotive applications","Failure analysis","Acceleration"
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2001. CAS 2001 Proceedings. International
  • Print_ISBN
    0-7803-6666-2
  • Type

    conf

  • DOI
    10.1109/SMICND.2001.967494
  • Filename
    967494
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3784053