Title :
Reliability of interleaving filter using planar lightwave circuit
Author :
Nounen, H. ; Arai, H. ; Chiba, T. ; Takasugi, S. ; Uetsuka, H.
Author_Institution :
Optoelectronic Syst. Lab., Hitachi Cable Ltd., Ibaraki, Japan
Abstract :
We have investigated reliability of an interleaving filter, which consists of Mach-Zehnder interferometer based on a silica planar lightwave circuit. This device is very stable and robust enough to be used over 25 years.
Keywords :
Mach-Zehnder interferometers; circuit reliability; optical filters; silicon compounds; wavelength division multiplexing; Mach-Zehnder interferometer; WDM; interleaving filter; reliability; silica planar lightwave circuit; stability; wavelength division multiplexing; Circuits; Interleaved codes; Optical filters; Optical interferometry; Packaging; Programmable control; Silicon compounds; Temperature dependence; Temperature sensors; Wavelength division multiplexing;
Conference_Titel :
Optical Communication, 2001. ECOC '01. 27th European Conference on
Print_ISBN :
0-7803-6705-7
DOI :
10.1109/ECOC.2001.989689
