DocumentCode
378535
Title
Evaluation of board level reliability of Pb-free PBGA solder joints
Author
Lee, Shi-Wei Ricky ; Lui, B.H.W.
Author_Institution
Electron. Packaging Lab., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fYear
2002
fDate
2002
Firstpage
82
Lastpage
89
Abstract
The present study is intended to evaluate the board level reliability of PBGA assemblies under thermal and mechanical loading. The main objective is to characterize the reliability of Pb-free solder joints with various assembly conditions. For the purpose of benchmarking, specimens with conventional Sn-Pb eutectic solder are tested in parallel as well. During the course of this study, a five-leg experiment is designed with various combinations of solder materials and peak reflow temperatures. The reliability tests include temperature cycling, three-point bending, and random vibration. It is found that the Pb-free solder joints have a much longer thermal fatigue life than the 63Sn-37Pb solder. Although there is no significant difference, the 63Sn-37Pb solder joints seem to perform slightly better than the Pb-free solder under the mechanical loading
Keywords
ball grid arrays; bending; plastic packaging; reflow soldering; reliability; thermal stress cracking; vibrations; PBGA solder joint; Pb-free alloy; Sn-Pb; Sn-Pb eutectic alloy; board level reliability; mechanical loading; random vibration; reflow temperature; temperature cycling; thermal fatigue life; thermal loading; three-point bending; Assembly; Benchmark testing; Chip scale packaging; Circuit testing; Electronic packaging thermal management; Electronics packaging; Laboratories; Plastic integrated circuit packaging; Soldering; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials, 2002. Proceedings. 2002 8th International Symposium on
Conference_Location
Stone Mountain, GA
Print_ISBN
0-7803-7434-7
Type
conf
DOI
10.1109/ISAPM.2002.990368
Filename
990368
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