• DocumentCode
    3785491
  • Title

    Past successes, future challenges

  • Author

    R. Gupta

  • Volume
    21
  • Issue
    2
  • fYear
    2004
  • Firstpage
    77
  • Lastpage
    78
  • Keywords
    "Testing","Fault tolerance","History","Pressing","Microelectronics","Integrated circuit packaging","Buildings","Electronic design automation and methodology","Manufacturing industries","Lead"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2004.1277897
  • Filename
    1277897
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3785491