DocumentCode :
3785491
Title :
Past successes, future challenges
Author :
R. Gupta
Volume :
21
Issue :
2
fYear :
2004
Firstpage :
77
Lastpage :
78
Keywords :
"Testing","Fault tolerance","History","Pressing","Microelectronics","Integrated circuit packaging","Buildings","Electronic design automation and methodology","Manufacturing industries","Lead"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2004.1277897
Filename :
1277897
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3785491
