• DocumentCode
    3785494
  • Title

    ITC 2003 panels: Part 1 [Panel Summaries]

  • Author

    C. Stolicny

  • Author_Institution
    Intel
  • Volume
    21
  • Issue
    2
  • fYear
    2004
  • Firstpage
    160
  • Lastpage
    163
  • Keywords
    "Logic testing","System testing","Manufacturing","Instruments","Costs","Fault detection","Computer networks","Computer network reliability","IP networks","Stability"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2004.1277910
  • Filename
    1277910
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3785494