DocumentCode
3785516
Title
Corrections to “Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices”
Author
R. Thalhammer;G. Wachutka
Volume
23
Issue
4
fYear
2004
Firstpage
581
Lastpage
582
Keywords
"Laser modes","Semiconductor lasers","Equations","Boundary conditions","Dielectric constant","Typesetting","Error correction","Interpolation","Sorting","Transforms"
Journal_Title
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2004.825598
Filename
1278535
Link To Document