• DocumentCode
    3785601
  • Title

    Errata to “Identification and Classification of Single-Event Upsets in the Configuration Memory of SRAM-Based FPGAs”

  • Author

    M. Ceschia;M. Violante;M. SonzaReorda;A. Paccagnella;P. Bernardi;M. Rebaudengo;D. Bortolato;M. Bellato;P. Zambolin;A. Candelori

  • Volume
    51
  • Issue
    2
  • fYear
    2004
  • Firstpage
    328
  • Lastpage
    328
  • Keywords
    "Single event upset","Curve fitting","Circuits"
  • Journal_Title
    IEEE Transactions on Nuclear Science
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.827944
  • Filename
    1284771
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3785601