• DocumentCode
    3785766
  • Title

    Guest Editorial Special Section on the International Conference on Microelectronic Test Structures

  • Author

    B. Verzi;A.J. Walton

  • Volume
    17
  • Issue
    2
  • fYear
    2004
  • Firstpage
    77
  • Lastpage
    78
  • Keywords
    "Microelectronics","Semiconductor device testing","Isolation technology","Manufacturing processes","Software testing","Fabrication","Circuit testing","Pulp manufacturing","Production","Semiconductor device manufacture"
  • Journal_Title
    IEEE Transactions on Semiconductor Manufacturing
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2004.826931
  • Filename
    1296709
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3785766