مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3785881

Title :

1985 to 1987: My years with D&T

Author :

V.D. Agrawal

Author_Institution :

Auburn University

Volume :

Issue :

fYear :

2004

Firstpage :

173

Lastpage :

174

Keywords :

"Design automation","System testing","Europe","Error analysis","Circuit simulation","Very large scale integration","Acceleration","Logic testing","Research and development","Automatic testing"

Journal_Title :

IEEE Design & Test of Computers

Publisher :

ieee

ISSN :

0740-7475

Type :

jour

DOI :

10.1109/MDT.2004.1

Filename :

1302081

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3785881