• DocumentCode
    3785881
  • Title

    1985 to 1987: My years with D&T

  • Author

    V.D. Agrawal

  • Author_Institution
    Auburn University
  • Volume
    21
  • Issue
    3
  • fYear
    2004
  • Firstpage
    173
  • Lastpage
    174
  • Keywords
    "Design automation","System testing","Europe","Error analysis","Circuit simulation","Very large scale integration","Acceleration","Logic testing","Research and development","Automatic testing"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2004.1
  • Filename
    1302081
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3785881