• DocumentCode
    3785948
  • Title

    Digital Logic Testing and Simulation, second edition [Book Review]

  • Author

    D. Nikolos

  • Volume
    7
  • Issue
    2
  • fYear
    2004
  • Firstpage
    78
  • Lastpage
    79
  • Keywords
    "Book reviews","Logic testing","Circuit testing","Circuit simulation","Built-in self-test","Instruments","Formal verification","Automatic test pattern generation","Design for testability","Clocks"
  • Journal_Title
    IEEE Instrumentation & Measurement Magazine
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2004.1304576
  • Filename
    1304576