Title :
True random bit generation from a double-scroll attractor
Author :
M.E. Yalcin;J.A.K. Suykens;J. Vandewalle
Author_Institution :
Dept. of Electr. Eng., Katholieke Univ. Leuven, Belgium
Abstract :
In this paper, a novel true random bit generator (TRBG) based on a double-scroll attractor is proposed. The double-scroll attractor is obtained from a simple model which is qualitatively similar to Chua´s circuit. In order to face the challenge of using the proposed TRBG in cryptography, the proposed TRBG is subjected to statistical tests which are the well-known Federal Information Processing Standards-140-1 and Diehard test suite in the area of cryptography. The proposed TRBG successfully passes all these tests and can be implemented in integrated circuits.
Keywords :
"Cryptography","Circuit testing","Random number generation","Semiconductor device noise","Hardware","Computer simulation","Entropy","Face","Information processing","Integrated circuit testing"
Journal_Title :
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI :
10.1109/TCSI.2004.830683