DocumentCode :
3786202
Title :
From the EIC: Manufacturing test woes
Volume :
21
Issue :
4
fYear :
2004
Firstpage :
269
Lastpage :
270
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2004.29
Filename :
1316771
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3786202
