• DocumentCode
    3786203
  • Title

    Design & Test Education in Asia

  • Author

    D.K. Das;H. Fujiwara; Yungang Li; Yinghua Min; Shiyi Xu;Y. Zorian

  • Volume
    21
  • Issue
    4
  • fYear
    2004
  • Firstpage
    331
  • Lastpage
    338
  • Keywords
    "Asia","Very large scale integration","Logic testing","Books","Computer science","Government","Hardware","Software tools","Computer science education","Semiconductor device manufacture"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2004.27
  • Filename
    1316780