DocumentCode
3786203
Title
Design & Test Education in Asia
Author
D.K. Das;H. Fujiwara; Yungang Li; Yinghua Min; Shiyi Xu;Y. Zorian
Volume
21
Issue
4
fYear
2004
Firstpage
331
Lastpage
338
Keywords
"Asia","Very large scale integration","Logic testing","Books","Computer science","Government","Hardware","Software tools","Computer science education","Semiconductor device manufacture"
Journal_Title
IEEE Design & Test of Computers
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2004.27
Filename
1316780
Link To Document