مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3786203

Title :

Design & Test Education in Asia

Author :

D.K. Das;H. Fujiwara; Yungang Li; Yinghua Min; Shiyi Xu;Y. Zorian

Volume :

Issue :

fYear :

2004

Firstpage :

331

Lastpage :

338

Keywords :

"Asia","Very large scale integration","Logic testing","Books","Computer science","Government","Hardware","Software tools","Computer science education","Semiconductor device manufacture"

Journal_Title :

IEEE Design & Test of Computers

Publisher :

ieee

ISSN :

0740-7475

Type :

jour

DOI :

10.1109/MDT.2004.27

Filename :

1316780

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3786203