• DocumentCode
    3786222
  • Title

    Methods for true energy-performance optimization

  • Author

    D. Markovic;V. Stojanovic;B. Nikolic;M.A. Horowitz;R.W. Brodersen

  • Author_Institution
    Berkeley Wireless Res. Center, Univ. of California, Berkeley, CA, USA
  • Volume
    39
  • Issue
    8
  • fYear
    2004
  • Firstpage
    1282
  • Lastpage
    1293
  • Abstract
    This paper presents methods for efficient energy-performance optimization at the circuit and micro-architectural levels. The optimal balance between energy and performance is achieved when the sensitivity of energy to a change in performance is equal for all the design variables. The sensitivity-based optimizations minimize energy subject to a delay constraint. Energy savings of about 65% can be achieved without delay penalty with equalization of sensitivities to sizing, supply, and threshold voltage in a 64-bit adder, compared to the reference design sized for minimum delay. Circuit optimization is effective only in the region of about /spl plusmn/30% around the reference delay; outside of this region the optimization becomes too costly either in terms of energy or delay. Using optimal energy-delay tradeoffs from the circuit level and introducing more degrees of freedom, the optimization is hierarchically extended to higher abstraction layers. We focus on the micro-architectural optimization and demonstrate that the scope of energy-efficient optimization can be extended by the choice of circuit topology or the level of parallelism. In a 64-bit ALU example, parallelism of five provides a three-fold performance increase, while requiring the same energy as the reference design. Parallel or time-multiplexed solutions significantly affect the area of their respective designs, so the overall design cost is minimized when optimal energy-area tradeoff is achieved.
  • Keywords
    "Optimization methods","Threshold voltage","Energy efficiency","Circuit topology","Design optimization","Constraint optimization","Circuit optimization","Delay effects","Parallel processing","Leakage current"
  • Journal_Title
    IEEE Journal of Solid-State Circuits
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2004.831796
  • Filename
    1317052