• DocumentCode
    3787168
  • Title

    Guest Editorial

  • Author

    G.G.E. Gielen;J. Figueras

  • Volume
    24
  • Issue
    1
  • fYear
    2005
  • Firstpage
    1
  • Lastpage
    3
  • Keywords
    "Circuit testing","Power system reliability","Design methodology","Design automation","Automatic testing","Dynamic voltage scaling","Frequency","Isolation technology","Electronic design automation and methodology","Software testing"
  • Journal_Title
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2004.841328
  • Filename
    1372656
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3787168