DocumentCode
378751
Title
Microscopic observation of Pb-free solder joint interface
Author
Miyatake, Sunao ; Watanabe, Hideo ; Sakatsu, Tsutomu ; Kadota, Yasushi ; Yamashita, Masaru ; Kanehara, Ryuji
Author_Institution
QAC Component Reliability Evaluation Office, Ricoh Co. Ltd., Japan
fYear
2001
fDate
2001
Firstpage
1137
Lastpage
1140
Abstract
Amid the growing concern about global environmental problems, there is a positive movement to reduce the amount of lead contained in the solder that is used for mounting printed circuit boards. Although many researchers have studied alternative solder materials and evaluated their reliability, there are few reports on a minute examination of the interface of solder joint. We considered that in order to evaluate the reliability of solder joint, it was indispensable to study the mechanism of alloy formation at the joint interface. Therefore, we made a microscopic observation of cross sections of solder joint specimens and examined the segregation of Pb from SnPb plating at the joint interface
Keywords
focused ion beam technology; interface structure; microcracks; printed circuit manufacture; scanning electron microscopy; segregation; soldering; FIB; PCB mounting; Pb-free solder joint interface; alloy formation; high-resolution observation; lead-free solder joint; micron-sized cracks; microscopic observation; printed circuit boards; reliability; segregation; solder materials; Copper alloys; Environmentally friendly manufacturing techniques; Failure analysis; Lead compounds; Materials reliability; Reliability engineering; Scanning electron microscopy; Semiconductor device reliability; Soldering; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Environmentally Conscious Design and Inverse Manufacturing, 2001. Proceedings EcoDesign 2001: Second International Symposium on
Conference_Location
Tokyo
Print_ISBN
0-7695-1266-6
Type
conf
DOI
10.1109/.2001.992541
Filename
992541
Link To Document