Title :
Microscopic observation of Pb-free solder joint interface
Author :
Miyatake, Sunao ; Watanabe, Hideo ; Sakatsu, Tsutomu ; Kadota, Yasushi ; Yamashita, Masaru ; Kanehara, Ryuji
Author_Institution :
QAC Component Reliability Evaluation Office, Ricoh Co. Ltd., Japan
Abstract :
Amid the growing concern about global environmental problems, there is a positive movement to reduce the amount of lead contained in the solder that is used for mounting printed circuit boards. Although many researchers have studied alternative solder materials and evaluated their reliability, there are few reports on a minute examination of the interface of solder joint. We considered that in order to evaluate the reliability of solder joint, it was indispensable to study the mechanism of alloy formation at the joint interface. Therefore, we made a microscopic observation of cross sections of solder joint specimens and examined the segregation of Pb from SnPb plating at the joint interface
Keywords :
focused ion beam technology; interface structure; microcracks; printed circuit manufacture; scanning electron microscopy; segregation; soldering; FIB; PCB mounting; Pb-free solder joint interface; alloy formation; high-resolution observation; lead-free solder joint; micron-sized cracks; microscopic observation; printed circuit boards; reliability; segregation; solder materials; Copper alloys; Environmentally friendly manufacturing techniques; Failure analysis; Lead compounds; Materials reliability; Reliability engineering; Scanning electron microscopy; Semiconductor device reliability; Soldering; Tin;
Conference_Titel :
Environmentally Conscious Design and Inverse Manufacturing, 2001. Proceedings EcoDesign 2001: Second International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
0-7695-1266-6
DOI :
10.1109/.2001.992541