• DocumentCode
    3787974
  • Title

    Guest Editorial Special Section on the International Conference on Microelectronic Test Structures

  • Author

    N. Kasai

  • Volume
    18
  • Issue
    2
  • fYear
    2005
  • Firstpage
    237
  • Lastpage
    237
  • Keywords
    "Microelectronics","Circuit testing","Integrated circuit testing","Research and development","MOSFETs","Integrated circuit interconnections","National electric code","Materials testing","Failure analysis","Pulp manufacturing"
  • Journal_Title
    IEEE Transactions on Semiconductor Manufacturing
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2005.845013
  • Filename
    1427790
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3787974