3787974

Guest Editorial Special Section on the International Conference on Microelectronic Test Structures

N. Kasai

18

2

2005

237

237

"Microelectronics","Circuit testing","Integrated circuit testing","Research and development","MOSFETs","Integrated circuit interconnections","National electric code","Materials testing","Failure analysis","Pulp manufacturing"

IEEE Transactions on Semiconductor Manufacturing

ieee

0894-6507

jour

10.1109/TSM.2005.845013

1427790