DocumentCode :
3788163
Title :
Applied Quantum Mechanics [Book Review]
Volume :
21
Issue :
3
fYear :
2005
Firstpage :
53
Lastpage :
53
Keywords :
"Book reviews","Quantum mechanics","Very large scale integration","Design automation","Particle scattering","Mathematical model","Transmission line theory","Filters","Tunneling","Electrons"
Journal_Title :
IEEE Circuits and Devices Magazine
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2005.1438815
Filename :
1438815
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3788163
