3788344

Correction to "Microwave measurement of conductivity and dielectric constant of semiconductors"

B.R. Nag;S.K. Roy;C.K. Chatterji

University of Calcutta, Calcutta, India

52

2

1964

185

185

"Conductivity measurement","Dielectric measurements","Microwave measurements","Dielectric constant","Semiconductor waveguides","Electrooptical waveguides","Length measurement","Absorption","Bleaching","Rectangular waveguides"

Proceedings of the IEEE

ieee

0018-9219

jour

10.1109/PROC.1964.2811

1444741