• DocumentCode
    3788866
  • Title

    Correction to "Problem in the analysis of semiconductor device materials exposed to ionizing radiation"

  • Author

    P.F. Schmidt

  • Author_Institution
    Bell Laboratories, Allentown, Pa.
  • Volume
    63
  • Issue
    2
  • fYear
    1975
  • Firstpage
    333
  • Lastpage
    333
  • Keywords
    "Semiconductor devices","Semiconductor materials","Ionizing radiation","Frequency shift keying","Chirp modulation","Baseband","Amplitude modulation","Noise level","Jitter","Frequency modulation"
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1975.9752
  • Filename
    1451682
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3788866