• DocumentCode
    3789692
  • Title

    Design of testable logic circuits

  • Author

    P.S. Bottorff

  • Author_Institution
    IBM Corporation Laboratory, Endicott, NY
  • Volume
    74
  • Issue
    1
  • fYear
    1986
  • Firstpage
    235
  • Lastpage
    235
  • Keywords
    "Circuit testing","Logic testing","Logic circuits","Books","Controllability","Observability","Software testing","Automatic testing","Logic design","Design engineering"
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1986.13449
  • Filename
    1457717
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3789692