DocumentCode :
3789704
Title :
Developments in expert systems
Author :
A. Micho
Author_Institution :
Schlumberger CAS Laboratory, Palo Alto, CA
Volume :
74
Issue :
3
fYear :
1986
Firstpage :
525
Lastpage :
526
Keywords :
"Expert systems","Circuit testing","Logic testing","Automatic testing","Delay","Logic circuits","Logic design","Books","Built-in self-test","Area measurement"
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1986.13498
Filename :
1457766
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3789704
