DocumentCode :
3789705
Title :
Design of testable logic circuits
Author :
T.W. Williams
Author_Institution :
IBM Corporation, Boulder, CO
Volume :
74
Issue :
3
fYear :
1986
Firstpage :
525
Lastpage :
525
Keywords :
"Circuit testing","Logic testing","Logic circuits","Automatic testing","Delay","Logic design","Books","Built-in self-test","Area measurement","Design automation"
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1986.13499
Filename :
1457767
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3789705
