DocumentCode :
3789958
Title :
Correction to "Thermally-induced cracking in the fabrication of semiconductor devices".
Author :
T.C. Taylor
Volume :
7
Issue :
2
fYear :
1960
Firstpage :
94
Lastpage :
94
Journal_Title :
IRE Transactions on Electron Devices
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1960.14599
Filename :
1472706
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3789958
