DocumentCode :
3790025
Title :
Correction to "Yield degradation of integrated circuits due to spot defects"
Author :
T. Yanagawa
Author_Institution :
Nippon Electric Company, Ltd., Kawasaki, Japan
Volume :
20
Issue :
5
fYear :
1973
Firstpage :
515
Lastpage :
515
Journal_Title :
IEEE Transactions on Electron Devices
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1973.17688
Filename :
1477345
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790025
