DocumentCode

3790025

Title

Correction to "Yield degradation of integrated circuits due to spot defects"

Author

T. Yanagawa

Author_Institution

Nippon Electric Company, Ltd., Kawasaki, Japan

Volume

20

Issue

5

fYear

1973

Firstpage

515

Lastpage

515

Journal_Title

IEEE Transactions on Electron Devices

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1973.17688

Filename

1477345