• DocumentCode
    3790097
  • Title

    Comments on "Depletion approximation analysis of the differential capacitance-voltage characteristics of an MOS structure with nonuniformly doped semiconductors"

  • Author

    R.R. O´Brien

  • Author_Institution
    IBM Corporation, Hopewell Junction, NY
  • Volume
    27
  • Issue
    9
  • fYear
    1980
  • Firstpage
    1848
  • Lastpage
    1849
  • Journal_Title
    IEEE Transactions on Electron Devices
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.20117
  • Filename
    1480910
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3790097