• DocumentCode
    3790107
  • Title

    Comments on "Determination of the minority-carrier base lifetime of junction transistors by measurement of basewidth-modulation conductances"

  • Author

    Ming-Guang Yi

  • Author_Institution
    Research Institute of Semicoductor Devices, Peking, China
  • Volume
    28
  • Issue
    1
  • fYear
    1981
  • Firstpage
    124
  • Lastpage
    124
  • Journal_Title
    IEEE Transactions on Electron Devices
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20295
  • Filename
    1481447
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3790107