3790123

Corrections to "Reliability of 0.87 µm (Al, Ga) As double heterostructure lasers with Ga (As, Sb) active layers"

P.J. Anthony;J.L. Zilko;R.L. Hartman;N.E. Schumaker;V. Swaminathan;W.R. Wagner

Bell Laboratories, Murray Hill, NJ, USA

2

4

1981

106

106

"Actuators","Temperature sensors","Sensor phenomena and characterization","Solid state circuits","Sensor systems","Microcomputers","Electronic equipment testing","Circuit testing","Instruments","System performance"

IEEE Electron Device Letters

ieee

0741-3106

jour

10.1109/EDL.1981.25358

1481842