• DocumentCode
    3790124
  • Title

    Corrections to "Discharging process by multiple tunnelings in MNOS structures"

  • Author

    H. Yamamoto;H. Iwasawa;A. Sasaki

  • Volume
    2
  • Issue
    5
  • fYear
    1981
  • Firstpage
    132
  • Lastpage
    132
  • Keywords
    "Tunneling","Charge coupled devices","Charge-coupled image sensors","Silicon","Interface states"
  • Journal_Title
    IEEE Electron Device Letters
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1981.25369
  • Filename
    1481853
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3790124