• DocumentCode
    3790177
  • Title

    The vertical hall-effect device

  • Author

    R.S. Popovic

  • Author_Institution
    LGZ Landis &
  • Volume
    5
  • Issue
    9
  • fYear
    1984
  • Firstpage
    357
  • Lastpage
    358
  • Abstract
    A novel device, sensitive to the magnetic field parallel to the chip surface is described. The device has a form remeniscent of a semi circular plate placed perpendicularly to the chip plane. The operation principle is that of the conventional Hall-effect device. The unusual geometry principally does not affect sensitivity. The experimental samples are fabricated using a standard bulk CMOS technology, where the p-well deep diffusion is used to surround the active device volume. Sensitivity up to 450 V/AT is measured.
  • Keywords
    "Hall effect devices","Geometry","Magnetic fields","CMOS technology","Magnetic field measurement","Insulation","Current density","Semiconductor device measurement","Temperature sensors"
  • Journal_Title
    IEEE Electron Device Letters
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25945
  • Filename
    1484321