DocumentCode
3790177
Title
The vertical hall-effect device
Author
R.S. Popovic
Author_Institution
LGZ Landis &
Volume
5
Issue
9
fYear
1984
Firstpage
357
Lastpage
358
Abstract
A novel device, sensitive to the magnetic field parallel to the chip surface is described. The device has a form remeniscent of a semi circular plate placed perpendicularly to the chip plane. The operation principle is that of the conventional Hall-effect device. The unusual geometry principally does not affect sensitivity. The experimental samples are fabricated using a standard bulk CMOS technology, where the p-well deep diffusion is used to surround the active device volume. Sensitivity up to 450 V/AT is measured.
Keywords
"Hall effect devices","Geometry","Magnetic fields","CMOS technology","Magnetic field measurement","Insulation","Current density","Semiconductor device measurement","Temperature sensors"
Journal_Title
IEEE Electron Device Letters
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1984.25945
Filename
1484321
Link To Document