DocumentCode
3790190
Title
Correction to "Measurement of diffusion length, lifetime, and surface recombination velocity in thin semiconductor layers"
Author
F.N. Gonzalez;A. Neugroschel
Volume
32
Issue
11
fYear
1985
Firstpage
2511
Lastpage
2512
Journal_Title
IEEE Transactions on Electron Devices
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1985.22306
Filename
1485052
Link To Document