DocumentCode

3790191

Title

Correction to "Electrical characterization of the boron-doped Si-SiO2interface"

Author

M.Y. Ghannam

Volume

32

Issue

11

fYear

1985

Firstpage

2512

Lastpage

2512

Journal_Title

IEEE Transactions on Electron Devices

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1985.22307

Filename

1485053