• DocumentCode
    3790195
  • Title

    Errata

  • Author

    G. Smith

  • Volume
    6
  • Issue
    2
  • fYear
    1985
  • Firstpage
    103
  • Lastpage
    103
  • Keywords
    "Boron","MOSFET circuits","Electron devices","Degradation","Error correction","Impurities"
  • Journal_Title
    IEEE Electron Device Letters
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1985.26058
  • Filename
    1485211