DocumentCode :
3790221
Title :
Reply to "Comment on ´An accurate method to extract specific contact resistivity using cross-bridge Kelvin resistors´"
Author :
S.E. Swirhun;W.M. Loh;E. Crabbe;R.M. Swanson;K.C. Saraswat
Author_Institution :
Stanford University, Stanford, CA
Volume :
7
Issue :
2
fYear :
1986
Firstpage :
142
Lastpage :
144
Keywords :
"Conductivity","Kelvin","Resistors","Contact resistance","Electrical resistance measurement","Testing","Australia","Error correction","Geometry","Laboratories"
Journal_Title :
IEEE Electron Device Letters
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1986.26323
Filename :
1486146
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790221
