• DocumentCode
    3790225
  • Title

    Errata

  • Author

    S.M. Sze

  • Volume
    7
  • Issue
    7
  • fYear
    1986
  • Firstpage
    458
  • Lastpage
    458
  • Keywords
    "Silicon on insulator technology","FETs","Threshold voltage","Leakage current","Transconductance","JFET integrated circuits","Integrated circuit technology","Application specific integrated circuits","Impact ionization","Degradation"
  • Journal_Title
    IEEE Electron Device Letters
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1986.26436
  • Filename
    1486259
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3790225