DocumentCode :
3790336
Title :
Digital Logic Testing and Simulation [Book Review]
Author :
T. Ndjountche
Volume :
21
Issue :
4
fYear :
2005
Firstpage :
37
Lastpage :
37
Keywords :
"Book reviews","Logic testing","Circuit testing","Circuit simulation","Laboratories","Circuit faults","Built-in self-test","Automatic test pattern generation","Internet","Very large scale integration"
Journal_Title :
IEEE Circuits and Devices Magazine
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2005.1492720
Filename :
1492720
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790336
