• DocumentCode
    3790336
  • Title

    Digital Logic Testing and Simulation [Book Review]

  • Author

    T. Ndjountche

  • Volume
    21
  • Issue
    4
  • fYear
    2005
  • Firstpage
    37
  • Lastpage
    37
  • Keywords
    "Book reviews","Logic testing","Circuit testing","Circuit simulation","Laboratories","Circuit faults","Built-in self-test","Automatic test pattern generation","Internet","Very large scale integration"
  • Journal_Title
    IEEE Circuits and Devices Magazine
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/MCD.2005.1492720
  • Filename
    1492720
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3790336