• DocumentCode
    3790638
  • Title

    Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing—Future of Semiconductor Test

  • Author

    S.R. Das;R. Rajsuman

  • Volume
    54
  • Issue
    5
  • fYear
    2005
  • Firstpage
    1659
  • Lastpage
    1661
  • Keywords
    "Semiconductor device testing","Sections","Very large scale integration","Automatic testing","Electronic equipment testing","Circuit testing","Logic testing","Costs","Radio frequency","Instruments"
  • Journal_Title
    IEEE Transactions on Instrumentation and Measurement
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2005.857481
  • Filename
    1514615
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3790638