• DocumentCode
    3791224
  • Title

    Correction to "Buck or Boost Tracking Power Converter"

  • Volume
    3
  • Issue
    4
  • fYear
    2005
  • Firstpage
    152
  • Lastpage
    152
  • Keywords
    "Semiconductor device testing","Electrons"
  • Journal_Title
    IEEE Power Electronics Letters
  • Publisher
    ieee
  • ISSN
    1540-7985
  • Type

    jour

  • DOI
    10.1109/LPEL.2006.869646
  • Filename
    1583615