• DocumentCode
    379127
  • Title

    Teaching integrated circuit and semiconductor device design in New Zealand: the University of Canterbury approach

  • Author

    Blaikie, Richard J. ; Alkaisi, Maan M. ; Durbin, Steven M. ; Cumming, David R S

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    223
  • Lastpage
    229
  • Abstract
    Teaching the practical aspects of device and chip design in New Zealand presents many problems, including high manufacturing costs, long lead times, and the lack of local industry strength. Nonetheless, it is possible to overcome these issues. This paper describes the courses in these areas at the University of Canterbury, including a practical IC design project that has been running successfully for the past four years. The IC design project takes final year students through a full custom design using modern design tools and fabrication processes. The design is quite straightforward - a 4-bit arithmetic logic unit - but it emphasises the importance of design, simulation and testing. The final circuits contain a few hundred transistors, so good practice is essential. Twelve designs are integrated on to a single chip to keep costs down, and individual designs are addressed via multiplexers. The designs are fabricated using a 0.5 micron process, accessed through a multi-project vendor (MOSIS). Getting chips back from a manufacturer is significantly more motivating for the students than just performing a paper design
  • Keywords
    application specific integrated circuits; electronic engineering education; integrated circuit design; project engineering; student experiments; 0.5 micron; 4 bit; MOSIS; New Zealand; University of Canterbury; design project; final year students; full custom design; integrated circuit design; lead times; local industry strength; manufacturing costs; multi-project vendor; semiconductor device design; Arithmetic; Chip scale packaging; Costs; Education; Fabrication; Logic testing; Manufacturing industries; Process design; Semiconductor device manufacture; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
  • Conference_Location
    Christchurch
  • Print_ISBN
    0-7695-1453-7
  • Type

    conf

  • DOI
    10.1109/DELTA.2002.994619
  • Filename
    994619