DocumentCode
379127
Title
Teaching integrated circuit and semiconductor device design in New Zealand: the University of Canterbury approach
Author
Blaikie, Richard J. ; Alkaisi, Maan M. ; Durbin, Steven M. ; Cumming, David R S
Author_Institution
Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
fYear
2002
fDate
2002
Firstpage
223
Lastpage
229
Abstract
Teaching the practical aspects of device and chip design in New Zealand presents many problems, including high manufacturing costs, long lead times, and the lack of local industry strength. Nonetheless, it is possible to overcome these issues. This paper describes the courses in these areas at the University of Canterbury, including a practical IC design project that has been running successfully for the past four years. The IC design project takes final year students through a full custom design using modern design tools and fabrication processes. The design is quite straightforward - a 4-bit arithmetic logic unit - but it emphasises the importance of design, simulation and testing. The final circuits contain a few hundred transistors, so good practice is essential. Twelve designs are integrated on to a single chip to keep costs down, and individual designs are addressed via multiplexers. The designs are fabricated using a 0.5 micron process, accessed through a multi-project vendor (MOSIS). Getting chips back from a manufacturer is significantly more motivating for the students than just performing a paper design
Keywords
application specific integrated circuits; electronic engineering education; integrated circuit design; project engineering; student experiments; 0.5 micron; 4 bit; MOSIS; New Zealand; University of Canterbury; design project; final year students; full custom design; integrated circuit design; lead times; local industry strength; manufacturing costs; multi-project vendor; semiconductor device design; Arithmetic; Chip scale packaging; Costs; Education; Fabrication; Logic testing; Manufacturing industries; Process design; Semiconductor device manufacture; Semiconductor devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location
Christchurch
Print_ISBN
0-7695-1453-7
Type
conf
DOI
10.1109/DELTA.2002.994619
Filename
994619
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