• DocumentCode
    379145
  • Title

    Property-specific testbench generation for guided simulation

  • Author

    Gupta, Aarti ; Casavant, Albert E. ; Ashar, Pranav ; Liu, X. G Sean ; Mukaiyama, Akira ; Wakabayashi, Kazutoshi

  • Author_Institution
    C&C Res. Labs., NEC, Princeton, NJ, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    524
  • Lastpage
    531
  • Abstract
    Simulation continues to be the primary technique for functional validation of designs. It is important that simulation vectors be effective in targeting the types of bugs designers expect to find rather than some generic coverage metrics. The overall focus of our work is to generate a property-specific testbench for guided simulation, that is targeted either at proving the correctness of a property or at finding a bug. This is facilitated by generation of a properly-specific model, called a "witness graph", which captures interesting paths in the design. Starting from an initial abstract model of the design, symbolic model checking, pruning, and refinement steps are applied in an iterative manner, until either a conclusive result is obtained or computing resources are exhausted. This paper describes the theoretical underpinnings of generating and using a witness graph for computation tree logic (CTL) correctness properties, practical issues related to the generation of a testbench, and experiences with an industrial example. We have been able to demonstrate on a real in-house LSI design that such an approach can lead to significant reduction in the time required to analyze the design for a CTL property and find a witness
  • Keywords
    circuit simulation; hardware description languages; integrated circuit design; integrated circuit modelling; integrated circuit testing; iterative methods; trees (mathematics); CTL correctness; LSI design; Verilog simulator; abstract design model; computation tree logic; computing resources; coverage metrics; design CTL property analysis; design functional validation; generic HDL-based simulation environments; guided simulation; iterative manner; model pruning; model refinement; properly-specific model; property-specific testbench; property-specific testbench generation; simulation vectors; symbolic model checking; target design bugs; witness graph; Computer bugs; Formal verification; Hardware; Identity-based encryption; Logic; National electric code; Space technology; State-space methods; Testing; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2002. Proceedings of ASP-DAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design. Proceedings.
  • Conference_Location
    Bangalore
  • Print_ISBN
    0-7695-1441-3
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2002.994973
  • Filename
    994973