DocumentCode :
379145
Title :
Property-specific testbench generation for guided simulation
Author :
Gupta, Aarti ; Casavant, Albert E. ; Ashar, Pranav ; Liu, X. G Sean ; Mukaiyama, Akira ; Wakabayashi, Kazutoshi
Author_Institution :
C&C Res. Labs., NEC, Princeton, NJ, USA
fYear :
2002
fDate :
2002
Firstpage :
524
Lastpage :
531
Abstract :
Simulation continues to be the primary technique for functional validation of designs. It is important that simulation vectors be effective in targeting the types of bugs designers expect to find rather than some generic coverage metrics. The overall focus of our work is to generate a property-specific testbench for guided simulation, that is targeted either at proving the correctness of a property or at finding a bug. This is facilitated by generation of a properly-specific model, called a "witness graph", which captures interesting paths in the design. Starting from an initial abstract model of the design, symbolic model checking, pruning, and refinement steps are applied in an iterative manner, until either a conclusive result is obtained or computing resources are exhausted. This paper describes the theoretical underpinnings of generating and using a witness graph for computation tree logic (CTL) correctness properties, practical issues related to the generation of a testbench, and experiences with an industrial example. We have been able to demonstrate on a real in-house LSI design that such an approach can lead to significant reduction in the time required to analyze the design for a CTL property and find a witness
Keywords :
circuit simulation; hardware description languages; integrated circuit design; integrated circuit modelling; integrated circuit testing; iterative methods; trees (mathematics); CTL correctness; LSI design; Verilog simulator; abstract design model; computation tree logic; computing resources; coverage metrics; design CTL property analysis; design functional validation; generic HDL-based simulation environments; guided simulation; iterative manner; model pruning; model refinement; properly-specific model; property-specific testbench; property-specific testbench generation; simulation vectors; symbolic model checking; target design bugs; witness graph; Computer bugs; Formal verification; Hardware; Identity-based encryption; Logic; National electric code; Space technology; State-space methods; Testing; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2002. Proceedings of ASP-DAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design. Proceedings.
Conference_Location :
Bangalore
Print_ISBN :
0-7695-1441-3
Type :
conf
DOI :
10.1109/ASPDAC.2002.994973
Filename :
994973
Link To Document :
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