• DocumentCode
    3791540
  • Title

    Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing—Future of Semiconductor Test

  • Author

    S.R. Das;R. Rajsuman

  • Volume
    55
  • Issue
    2
  • fYear
    2006
  • Firstpage
    378
  • Lastpage
    380
  • Keywords
    "Semiconductor device testing","Sections","Very large scale integration","Circuit testing","Integrated circuit testing","System testing","Built-in self-test","Logic testing","Integrated circuit measurements","Transceivers"
  • Journal_Title
    IEEE Transactions on Instrumentation and Measurement
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2006.873383
  • Filename
    1608578
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3791540