Title :
Reliable laser programmable gate array technology
Author :
Gao, Zhuo ; Luo, JI ; Huang, Hu ; Zhang, Wei ; Bernstein, Joseph B.
Author_Institution :
Maryland Univ., College Park, MD, USA
Abstract :
Field-programmable gate arrays have become popular ever since their introduction. Compared to other digital circuit implementation media, they have lower non-recurring engineering (NRE) cost and rapid turnaround with the penalties of reduced speed and larger size. Thus better FPGA programmable switch technology is desired in order to gain speed and density advantages. In this paper, laser-induced MakeLink™ technology is proposed as a programmable switch element. The electrical resistance is as low as 0.8 Ω to 11 Ω, depending on the size of the link, which is 2-3 orders smaller than that of NMOS transistor in a SRAM based FPGA. Thus the speed improvement for laser field-programmable gate array (LFPGA) is significant. Other features of laser-induced vertical links technology, such as small size and radiation hardness, can also greatly improve the FPGA performance. The cluster-based LFPGA with 128 by 64 basic logic elements (BLE) is laid out under a 0.5 μm commercialized technology. The chip size is about 138 mm2.
Keywords :
PLD programming; field programmable gate arrays; integrated circuit layout; integrated circuit reliability; laser beam applications; logic design; microprogramming; radiation hardening (electronics); 0.5 micron; 0.8 to 11 ohm; FPGA performance; FPGA programmable switch technology; LFPGA; NRE cost; basic logic elements; chip size; cluster-based LFPGA; digital circuit implementation; electrical resistance; field-programmable gate arrays; laser field-programmable gate array; laser-induced MakeLink technology; laser-induced vertical links technology; link size; nonrecurring engineering costs; programmable switch element; radiation hardness; rapid turnaround; reliable laser programmable gate array technology; Costs; Digital circuits; Electric resistance; Field programmable gate arrays; Logic; MOSFETs; Optical arrays; Random access memory; Reliability engineering; Switches;
Conference_Titel :
Quality Electronic Design, 2002. Proceedings. International Symposium on
Print_ISBN :
0-7695-1561-4
DOI :
10.1109/ISQED.2002.996744